Dynamic study on effect of secondary electron on ion beam quality

Meng Xiaohui; Dong Zhiwei

doi:10.11884/HPLPB201830.180135

Volume 30 Issue 11

Nov. 2018

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Article Navigation > High Power Laser and Particle Beams > 2018 > 30(11): 114005

Meng Xiaohui, Dong Zhiwei. Dynamic study on effect of secondary electron on ion beam quality[J]. High Power Laser and Particle Beams, 2018, 30: 114005. doi: 10.11884/HPLPB201830.180135

Citation:

Meng Xiaohui, Dong Zhiwei. Dynamic study on effect of secondary electron on ion beam quality[J]. High Power Laser and Particle Beams, 2018, 30: 114005. doi: 10.11884/HPLPB201830.180135

Meng Xiaohui, Dong Zhiwei. Dynamic study on effect of secondary electron on ion beam quality[J]. High Power Laser and Particle Beams, 2018, 30: 114005. doi: 10.11884/HPLPB201830.180135

Citation:

Meng Xiaohui, Dong Zhiwei. Dynamic study on effect of secondary electron on ion beam quality[J]. High Power Laser and Particle Beams, 2018, 30: 114005. doi: 10.11884/HPLPB201830.180135

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Dynamic study on effect of secondary electron on ion beam quality

doi: 10.11884/HPLPB201830.180135

Meng Xiaohui^1
,,
Dong Zhiwei^{2
,
,}

1.
Graduate School, China Academy of Engineering Physics, Beijing 100088, China
1.
Institute of Applied Physics and Computational Mathematics, Beijing 100094, China

Received Date: 2018-05-09
Rev Recd Date: 2018-08-28
Publish Date: 2018-11-15

Abstract

Abstract

This paper uses the technique of particle-in-cell to build an accelerating section model with external circuit to simulate the electron effect of deuterium ion beam bombarding the target surface and analyze the influence of secondary electrons on acceleration voltage, quality of deuterium ion beam and energy beam bombarding the target dynamically. The results indicate that the acceleration voltage will decrease 45% when there is 0.06 A electron current, which then lead to the deterioration of deuterium ion beam's quality. The energy of beam bombarding the target decrease 43.5%, which will influence the neutron yield.
- particle-in-cell,
- external circuit model,
- compact neutron tube,
- deuterium ion beams,
- secondary electrons

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References(15)

References

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