Calibration of bipolar transistor neutron fluence detector

Feng Jiaming; Zou Dehui; Fan Xiaoqiang; Ge Liangquan; Wu Kunlin; Luo Junyi; Sun Wenqing; Ai Zihui

doi:10.11884/HPLPB201830.180138

Volume 30 Issue 9

Sep. 2018

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Feng Jiaming, Zou Dehui, Fan Xiaoqiang, et al. Calibration of bipolar transistor neutron fluence detector[J]. High Power Laser and Particle Beams, 2018, 30: 096008. doi: 10.11884/HPLPB201830.180138

Citation:

Feng Jiaming, Zou Dehui, Fan Xiaoqiang, et al. Calibration of bipolar transistor neutron fluence detector[J]. High Power Laser and Particle Beams, 2018, 30: 096008. doi: 10.11884/HPLPB201830.180138

Feng Jiaming, Zou Dehui, Fan Xiaoqiang, et al. Calibration of bipolar transistor neutron fluence detector[J]. High Power Laser and Particle Beams, 2018, 30: 096008. doi: 10.11884/HPLPB201830.180138

Citation:

Feng Jiaming, Zou Dehui, Fan Xiaoqiang, et al. Calibration of bipolar transistor neutron fluence detector[J]. High Power Laser and Particle Beams, 2018, 30: 096008. doi: 10.11884/HPLPB201830.180138

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Calibration of bipolar transistor neutron fluence detector

doi: 10.11884/HPLPB201830.180138

1.
Institute of Nuclear Physics and Chemistry, CAEP, Mianyang 621900, China
2.
Institute of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu 610000, Chin

Received Date: 2018-05-15
Rev Recd Date: 2018-06-13
Publish Date: 2018-09-15

Abstract

Abstract

The DC gain of bipolar transistor will degenerate after neutron irradiation. In the range of flux of 10⁹-10¹⁶ cm^-2, the reciprocal change of DC gain is linearly related to the neutron flux. The high temperature annealing of the bipolar transistor with DC gain degradation can restore the performance of the bipolar transistor which has been damaged by radiation. In view of this, the bipolar transistor was used in reverse engineering, and the neutron flux detector was fabricated. After calibration, the neutron flux could be monitored. After designing the assembly structure of the detector and relying on the CFBR-Ⅱ reactor, the 3DK2222A detector was calibrated in the flux range of 10¹²-10¹³cm^-2. The 3DG121C detector is calibrated in the flux range of 10¹³ cm^-2. The dispersion of the damage constant K of the detector is obtained as smaller or larger, the effective value and application method of the smaller dispersion are determined, and in cases of larger dispersion, the calibrated damage constant K can only be applied to the same detector, and the feasibility of the scheme is proved by high temperature annealing experiment.
- bipolar transistor,
- neutron fluence detector,
- damage constant,
- high temperature annealing,
- calibration technique

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References(7)

References

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