System-level electrostatic discharge simulation based on transmission line pulse modeling

Chen Qiang; Xu Ke; Chen Zhenzhen; Chen Xing

doi:10.11884/HPLPB201931.190113

Volume 31 Issue 10

Oct. 2019

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Article Navigation > High Power Laser and Particle Beams > 2019 > 31(10): 103208

Chen Qiang, Xu Ke, Chen Zhenzhen, et al. System-level electrostatic discharge simulation based on transmission line pulse modeling[J]. High Power Laser and Particle Beams, 2019, 31: 103208. doi: 10.11884/HPLPB201931.190113

Citation:

Chen Qiang, Xu Ke, Chen Zhenzhen, et al. System-level electrostatic discharge simulation based on transmission line pulse modeling[J]. High Power Laser and Particle Beams, 2019, 31: 103208. doi: 10.11884/HPLPB201931.190113

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System-level electrostatic discharge simulation based on transmission line pulse modeling

doi: 10.11884/HPLPB201931.190113

School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China

Received Date: 2019-04-17
Rev Recd Date: 2019-05-16
Publish Date: 2019-10-15

Abstract

Abstract

Effective protection can be conducted before an electronic system is measured through system-level ESD simulation. In this paper, the spice behavioral modeling for the transient voltage suppressor and IC pins are presented using the measured transmission line pulse (TLP) data. A system-level ESD simulation methodology is proposed, including the equivalent circuit model of ESD pulse source, S-parameter model of PCB board, TLP model of TVS protection diode, IC pins and co-simulation technology. A switch chip protect circuit is simulated and measured under IEC 61000-4-2 ESD stress. The good agreement between simulated and measured voltage waveforms demonstrates the effectiveness of the proposed simulation method.
- electrostatic discharge,
- TLP,
- TVS diode,
- spice model,
- field-circuit co-simulation

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References(11)

References

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