X-ray spot size measurement with pinhole

Li Qin; Wang Yi; Liu Yunlong; Qi Shuangxi; Cheng Jinming; Long Quanhong; Li Tiantao

doi:10.11884/HPLPB202133.200132

Volume 33 Issue 4

May 2021

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Article Navigation > High Power Laser and Particle Beams > 2021 > 33(4): 044007

Zhou Xiaohong, Ren Xiaoming, Wei Chengfu, et al. Two-dimensional beam shaping for beams with large aspect ratio and variable divergence angle[J]. High Power Laser and Particle Beams, 2017, 29: 071003. doi: 10.11884/HPLPB201729.160520

Citation:

Li Qin, Wang Yi, Liu Yunlong, et al. X-ray spot size measurement with pinhole[J]. High Power Laser and Particle Beams, 2021, 33: 044007. doi: 10.11884/HPLPB202133.200132

Citation:

Li Qin, Wang Yi, Liu Yunlong, et al. X-ray spot size measurement with pinhole[J]. High Power Laser and Particle Beams, 2021, 33: 044007. doi: 10.11884/HPLPB202133.200132

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X-ray spot size measurement with pinhole

doi: 10.11884/HPLPB202133.200132

Key Laboratory of Pulsed Power, Institute of Fluid Physics, CAEP, P.O.Box 919-106, Mianyang 621900, China

Received Date: 2020-05-18
Rev Recd Date: 2020-11-16

Available Online: 2021-03-17

Publish Date: 2021-05-02

Abstract

Abstract

The high intense pulse electron beam emitted and accelerated by linear induction accelerator (LIA) is focused to heavy metal target to produce X-ray pulses via bremsstrahlung mechanism. The X-ray is applied to high energy flash radiography. The X-ray spot size is a critical parameter for LIA and the main factor which degrades resolution of the flash radiography. This paper describes a pinhole imaging system measuring the X-ray spot size. The full width at half maximum (FWHM) of the X-ray spot size can be obtained from the pinhole image data. The modulation transfer function (MTF) which is derived from the X-ray spot image by Fourier transform is applied to calculate the 50%MTF spot size. In the continuous experiments of multi-pulse electron linear induction accelerator (MPELIA), the X-ray spot size is measured and the results demonstrate reliable performance of MPELIA. The concept of form factor is introduced, and the measured results show that the MPLIA X-ray spot distribution changes between Gaussian and Bennett distribution.
- high energy X-ray spot,
- spot size,
- pinhole,
- MTF,
- form factor

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References(9)

References

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