Simulation of the solenoid scan method used in overlapping field for thermal emittance measurement

Fan Peiliang; He Xiaozhong; Yang Liu; Wei Tao; Jiang Xiaoguo; Li Yiding; Zhang Xiaoding; Wang Ke; Yang Xinglin

doi:10.11884/HPLPB202133.200197

Volume 33 Issue 2

Jan. 2021

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Article Navigation > High Power Laser and Particle Beams > 2021 > 33(2): 024003

Fan Peiliang, He Xiaozhong, Yang Liu, et al. Simulation of the solenoid scan method used in overlapping field for thermal emittance measurement[J]. High Power Laser and Particle Beams, 2021, 33: 024003. doi: 10.11884/HPLPB202133.200197

Citation:

Fan Peiliang, He Xiaozhong, Yang Liu, et al. Simulation of the solenoid scan method used in overlapping field for thermal emittance measurement[J]. High Power Laser and Particle Beams, 2021, 33: 024003. doi: 10.11884/HPLPB202133.200197

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Simulation of the solenoid scan method used in overlapping field for thermal emittance measurement

doi: 10.11884/HPLPB202133.200197

Institute of Fluid Physics, CAEP, Mianyang 621900, China

Received Date: 2020-07-13
Rev Recd Date: 2020-10-21
Publish Date: 2021-01-07

Abstract

Abstract

In one high repetition frequency X-ray free electron laser (XFEL) equipment, the electron gun and compensate solenoid have special structure in the photoinjector, thus the electric field and the magnetic field overlaps near the cathode. The thermal emittance of the cathode should be measured in the experiment. The solenoid scan method used to measure the thermal emittance is not suitable for the overlapping field, because it works effectively only when the rms emittance keeps constant. As the normalized phase space can avoid the influence of the electric field, we tried to use the solenoid scan method in normalized phase space. Using simulation code to do simulations and analysis, we finally demonstrate that this method is feasible for measurement of thermal emittance of the photoinjector which has overlapping field.
- thermal emittance,
- solenoid scan method,
- phase space,
- electron gun

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References(16)

References

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