Time-and-energy combined numerical simulation of pulsed X-ray radiation effect

Chen Yu; Yue Dongli; Zhong Hui; Zhang Yuqi; Hao Yi; Zhang Jingwen; Zhu Xiaofeng

doi:10.11884/HPLPB202133.210145

Volume 33 Issue 10

Oct. 2021

Turn off MathJax

Article Contents

Article Navigation > High Power Laser and Particle Beams > 2021 > 33(10): 104003

Chen Yu, Yue Dongli, Zhong Hui, et al. Time-and-energy combined numerical simulation of pulsed X-ray radiation effect[J]. High Power Laser and Particle Beams, 2021, 33: 104003. doi: 10.11884/HPLPB202133.210145

Citation:

Chen Yu, Yue Dongli, Zhong Hui, et al. Time-and-energy combined numerical simulation of pulsed X-ray radiation effect[J]. High Power Laser and Particle Beams, 2021, 33: 104003. doi: 10.11884/HPLPB202133.210145

Citation:

PDF( 1300 KB)

Time-and-energy combined numerical simulation of pulsed X-ray radiation effect

doi: 10.11884/HPLPB202133.210145

1.
School of Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
2.
Institute of Electronic Engineering, CAEP, Mianyang 621000, China

Received Date: 2021-04-13
Rev Recd Date: 2021-09-22

Available Online: 2021-10-16

Publish Date: 2021-10-15

Abstract

Abstract

In the study of pulsed X-ray radiation effect, it is necessary to integrate the information of time dimension into the simulation model, and then realize the numerical simulation of radiation effect based on time energy joint method, which provides a research idea for the simulation of transient pulsed radiation effect. The model of bremsstrahlung shooting is established, and the energy spectrum of outgoing pulsed X-ray is calculated. Combined with the radiation effect simulation model of radiation object, the energy deposition of alumina ceramic sample at different time and different incident depth was obtained.
- bremsstrahlung radiation,
- time energy combination,
- pulsed X-ray,
- radiation effect

FullText(HTML)

References(10)

References

[1]	Wetzer J M, Wouters P A A F. HV design of vacuum components[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1995, 2(2): 202-209. doi: 10.1109/94.388241
[2]	Saito Y, Matuda N, Anami S, et al. Breakdown of alumina RF windows[J]. Review of Scientific Instruments, 1989, 60(7): 1736-1739. doi: 10.1063/1.1140942
[3]	Vlieks A E, Allen M A, Callin R S, et al. Breakdown phenomena in high-power klystrons[J]. IEEE Transactions on Electrical Insulation, 1989, 24(6): 1023-1028. doi: 10.1109/14.46331
[4]	Kalbreier W, Goddard B. Radiation-triggered breakdown phenomena in high-energy e⁺e^- colliders[J]. IEEE Transactions on Electrical Insulation, 1993, 28(4): 444-453. doi: 10.1109/14.231524
[5]	张雨琦. 强脉冲X射线下介质材料辐照感应电导率研究[D]. 西安: 西安交通大学, 2019 Zhang Yuqi. Research on induced conductivity of dielectric materials irradiated by intense pulse X-ray[D]. Xi’an: Xi’an Jiaotong University, 2019
[6]	来定国, 张永民, 李进玺, 等. 强流电子束轫致辐射复合薄靶设计[J]. 强激光与粒子束, 2013, 25(6):1396-1400. (Lai Dingguo, Zhang Yongmin, Li Jinxi, et al. Design of bremsstrahlung composite thin converter for high current electron beams[J]. High Power Laser and Particle Beams, 2013, 25(6): 1396-1400 doi: 10.3788/HPLPB20132506.1396
[7]	邱爱慈. 脉冲X射线模拟源技术的发展[J]. 中国工程科学, 2000, 2(9): 24-28. Qiu Aici. Development of pulse X-ray analog source technology[J]. Chinese Engineering Science, 2000, 2(9): 24-28
[8]	苏兆锋, 杨海亮, 邱爱慈, 等. 高能脉冲X射线能谱测量[J]. 物理学报, 2010, 59(11):7729-7735. (Su Zhaofeng, Yang Hailiang, Qiu Aici, et al. High-energy pulsed X-ray energy spectrum measurement[J]. Acta Physica Sinica, 2010, 59(11): 7729-7735 doi: 10.7498/aps.59.7729
[9]	来定国, 张永民, 李进玺, 等. 脉冲硬X射线能谱软化方法数值分析[J]. 原子能科学技术, 2014, 8(2):336-340. (Lai Dingguo, Zhang Yongmin, Li Jinxi, et al. Numerical analysis of softening method of pulse hard X-ray energy spectrum[J]. Atomic Energy Science and Technology, 2014, 8(2): 336-340 doi: 10.7538/yzk.2014.48.02.0336
[10]	苏兆锋, 来定国, 邱孟通, 等. 15~600 keV脉冲硬X射线能谱测量[J]. 强激光与粒子束, 2020, 32:035005. (Su Zhaofeng, Lai Dingguo, Qiu Mengtong, et al. Energy spectrum measurement for pulsed hard X-ray from 15 keV to 600 keV[J]. High Power Laser and Particle Beams, 2020, 32: 035005 doi: 10.11884/HPLPB202032.190354