Single energy X-ray source for calibration of X-ray detectors

Xu Zefang; Yan Yongqing; Qiang Pengfei; Tang Bo; Sheng Lizhi; Su Tong; Li Yun; Zhang Ruili

doi:10.11884/HPLPB202335.220422

Volume 35 Issue 9

Sep. 2023

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Article Navigation > High Power Laser and Particle Beams > 2023 > 35(9): 091007

Wu Hanyu, Zhang Xinjun, Wang Liangping, et al. Restraint of focus spot drift of electron-beam in bremsstrahlung radiation[J]. High Power Laser and Particle Beams, 2015, 27: 075105. doi: 10.11884/HPLPB201527.075105

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Xu Zefang, Yan Yongqing, Qiang Pengfei, et al. Single energy X-ray source for calibration of X-ray detectors[J]. High Power Laser and Particle Beams, 2023, 35: 091007. doi: 10.11884/HPLPB202335.220422

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Single energy X-ray source for calibration of X-ray detectors

doi: 10.11884/HPLPB202335.220422

Xu Zefang^{1, 2
,},
Yan Yongqing¹,
Qiang Pengfei^{1
,
,},
Tang Bo³,
Sheng Lizhi¹,
Su Tong¹,
Li Yun^{1, 2},
Zhang Ruili¹

1.
State Key Laboratory of Transent Optics and Photonics, Xi ’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
2.
University of Chinese Academy of Sciences, Beijing 100084, China
3.
Northwest Nuclear Technology Institute, Xi’an 710024, China

Received Date: 2022-12-22
Accepted Date: 2023-06-17
Rev Recd Date: 2023-06-26

Available Online: 2023-06-30

Publish Date: 2023-09-15

Abstract

Abstract

To improve the calibration accuracy of X-ray detectors, this paper presents a method of placing filters in fluorescent X-ray emission channels to improve the purity of X-rays. Monte Carlo simulation model was established to analyze the relationship between the probability of photoelectric effect in K layer and the atomic number, and the curve of fluorescence intensity and purity with filter thickness was obtained. In atmospheric environment, the energy spectrum distribution and photon flux of fluorescent X-ray source were measured by silicon drift semiconductor detector, and the effect of X-ray tube voltage on photon flux and fluorescence purity was analyzed. When the radiator material is copper and the thickness of the filter (nickel) is 0 μm, 10 μm and 30 μm, the purity of fluorescence X-ray measured is 75.61%, 85.38% and 84.25%, and the photon flux is 3425 phs/s, 2023 phs/s and 1192 phs/s, respectively. The influence of filter thickness on the purity and intensity of fluorescent X-ray is confirmed, which provides a direction for solving the problem that it is difficult to calibrate X-ray detectors with high accuracy due to the lack of monochromatism of fluorescent X-ray light source.
- fluorescent X-ray source,
- filter,
- calibration of detector

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References(20)

References

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