Refractivity profile distribution model for infrared waves

Sun Zheng; Ning Hui; Xie YongJie; Cao Xin

doi:10.3788/HPLPB20122412.2778

Volume 24 Issue 12

Nov. 2012

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Article Navigation > High Power Laser and Particle Beams > 2012 > 24(12): 2778-2782

Chen Juanjuan, Zhang Tianping, Jia Yanhui, et al. Performance optimization of 20 cm xenon ion thruster discharge chamber[J]. High Power Laser and Particle Beams, 2012, 24: 2469-2473. doi: 10.3788/HPLPB20122410.2469

Citation:

Sun Zheng, Ning Hui, Xie YongJie, et al. Refractivity profile distribution model for infrared waves[J]. High Power Laser and Particle Beams, 2012, 24: 2778-2782. doi: 10.3788/HPLPB20122412.2778

Citation:

Sun Zheng, Ning Hui, Xie YongJie, et al. Refractivity profile distribution model for infrared waves[J]. High Power Laser and Particle Beams, 2012, 24: 2778-2782. doi: 10.3788/HPLPB20122412.2778

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Refractivity profile distribution model for infrared waves

doi: 10.3788/HPLPB20122412.2778

1.
Northwest Institute of Nuclear Technology,P.O.Box 21-188,Xi’an 710024,China

Received Date: 2012-04-12
Rev Recd Date: 2012-06-13
Publish Date: 2012-11-05

Abstract

Abstract

Atmospheric refractivity significantly influences optoelectronic measuring accuracy and laser propagation, so an accurate knowledge of the refractivity profile is important. In this paper, calculations of the refractive index using atmospheric parameters for the near and middle infrared are carried out, and then the refractivity profiles of the Gobi zone in Xinjiang are obtained from the sounding data for the latest few years. The statistical distributions of the refractive index in every season for wavelengths of 4 m and 1.32 m are discussed in detail, and the three-parameter exponential mode is proposed to describe the mean refractivity profile. A three-parameter exponential profile for wavelengths of 4 m and 1.32 m in every season is given by nonlinear fitting. The statistical refractive profile is used to correct the refractive error of the data obtained from the optoelectronic equipments in real-time. This correction result is compared with the post correction result using the measured profile, with the difference of them less than 5.
- atmospheric optics,
- optoelectronic measurement,
- refractive error correction,
- refractivity profile,
- three-parameter exponential mode

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