Designing microwave effect experiment based on Bayesian sequential test method

Han Feng; Lu Xicheng; Liu Yu; Yang Zhiqiang; Wang Jianguo

doi:10.3788/HPLPB20132502.0411

Volume 25 Issue 02

Dec. 2012

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Article Navigation > High Power Laser and Particle Beams > 2013 > 25(02): 411-414

Wang Songsong, Shu Ting, Yang Hanwu. Analytical expression of output pulse for stacked Blumlein line[J]. High Power Laser and Particle Beams, 2013, 25: 1409-1413. doi: 10.3788/HPLPB20132506.1409

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Han Feng, Lu Xicheng, Liu Yu, et al. Designing microwave effect experiment based on Bayesian sequential test method[J]. High Power Laser and Particle Beams, 2013, 25: 411-414. doi: 10.3788/HPLPB20132502.0411

Wang Songsong, Shu Ting, Yang Hanwu. Analytical expression of output pulse for stacked Blumlein line[J]. High Power Laser and Particle Beams, 2013, 25: 1409-1413. doi: 10.3788/HPLPB20132506.1409

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Designing microwave effect experiment based on Bayesian sequential test method

doi: 10.3788/HPLPB20132502.0411

1.
Northwest Institute of Nuclear Technology,P.O.Box 69-5,Xi’an 710024,China

Received Date: 2012-04-27
Rev Recd Date: 2012-06-08
Publish Date: 2013-02-10

Abstract

Abstract

A sequential test method based on Bayesian posterior probability was proposed to perform tests of hypotheses about probability of success of binomial distribution in complicated hypothesis conditions. The decision rules were constructed and the method for calculating the criterion value was given. For a given maximal sample size, the truncated method of judge criteria for hypothesis test was discussed. An experimental program was given to test the hypotheses about the probability of failure of device affected by microwave using the proposed method. At last, an example was presented to illustrate the proposed method and the result is compared with that of the existing methods.
- sequential test,
- Bayesian method,
- microwave effect,
- design of experiment,
- sample size

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