Volume 25 Issue 02
Dec.  2012
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Wang Xuefeng, Wang Jianguo, et al. Responses of silicon bar fixed in waveguide to high power terahertz pulse[J]. High Power Laser and Particle Beams, 2013, 25: 455-460. doi: 10.3788/HPLPB20132502.0455
Citation: Wang Xuefeng, Wang Jianguo, et al. Responses of silicon bar fixed in waveguide to high power terahertz pulse[J]. High Power Laser and Particle Beams, 2013, 25: 455-460. doi: 10.3788/HPLPB20132502.0455

Responses of silicon bar fixed in waveguide to high power terahertz pulse

doi: 10.3788/HPLPB20132502.0455
  • Received Date: 2012-09-18
  • Rev Recd Date: 2012-11-06
  • Publish Date: 2013-02-10
  • Researches on responses of an n-type silicon bar fixed in a rectangular waveguide to high power terahertz pulse have been carried out for the 0.3~0.4 THz band. The distribution of electromagnetic field components, voltage standing-wave ratio(VSWR) in the waveguide, and the average electric field in the n-type silicon bar is determined by means of a three-dimensional finite-difference time-domain method. By adjusting several factors, such as the length, width, height and the specific resistance of the silicon bar, a novel project of a sensor that can be used as measurement device for high power terahertz pulse directly is presented. The relative sensitivity of the sensor is about 0.509 kW-1, its fluctuation is in the range of 14%, and its VSWR is no more than 1.34.
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