Volume 25 Issue 02
Dec.  2012
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Article Navigation >  High Power Laser and Particle Beams  > 2013  >  25(02): 490-494
Wang Weining, Wang Feng, Jiang Shao’en, et al. Accuracy examination of shock speed measurement by imaging velocity interferometer system for any reflector[J]. High Power Laser and Particle Beams, 2012, 24: 2121-2124. doi: 10.3788/HPLPB20122409.2121
Citation: Zhao Mo, Cheng Yinhui, Wu Wei, et al. Numerical simulation for calculating transient response of coaxial line with diode to pulsed X-ray[J]. High Power Laser and Particle Beams, 2013, 25: 490-494. doi: 10.3788/HPLPB20132502.0490
shu

Numerical simulation for calculating transient response of coaxial line with diode to pulsed X-ray

doi: 10.3788/HPLPB20132502.0490
  • 1.

    Northwest Institute of Nuclear Technology,P.O.Box 69-10,Xi’an 710024,China

  • Received Date: 2012-05-16
  • Rev Recd Date: 2012-07-31
  • Publish Date: 2013-02-10
    Abstract
  • This paper introduces the transmission line method which is used to calculate the coaxial response to X-ray and the drift-diffusion method which is used to calculate the parameters of semiconductor devices. Combining the transmission line method with the drift-diffusion method, we calculated the X-ray transient response of coaxial line with PIN diode. The coupled model shows the relation of coaxial lines response to pulsed X-ray and the diodes status. An example was calculated using the coupled model, the implications of the data were discussed in detail. The coupled model can be used in calculating the responses of coaxial lines with other semiconductor devices to pulsed X-ray.
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