Cheng Xiaofeng, Wang Hongbin, Miao Xinxiang, et al. Contamination control for high-power solid-state laser driver and improvement of cleanliness in slab amplifiers[J]. High Power Laser and Particle Beams, 2013, 25: 1147-1151. doi: 10.3788/HPLPB20132505.1147
Citation:
Cheng Xiaofeng, Wang Hongbin, Miao Xinxiang, et al. Contamination control for high-power solid-state laser driver and improvement of cleanliness in slab amplifiers[J]. High Power Laser and Particle Beams, 2013, 25: 1147-1151. doi: 10.3788/HPLPB20132505.1147
Cheng Xiaofeng, Wang Hongbin, Miao Xinxiang, et al. Contamination control for high-power solid-state laser driver and improvement of cleanliness in slab amplifiers[J]. High Power Laser and Particle Beams, 2013, 25: 1147-1151. doi: 10.3788/HPLPB20132505.1147
Citation:
Cheng Xiaofeng, Wang Hongbin, Miao Xinxiang, et al. Contamination control for high-power solid-state laser driver and improvement of cleanliness in slab amplifiers[J]. High Power Laser and Particle Beams, 2013, 25: 1147-1151. doi: 10.3788/HPLPB20132505.1147
The contamination control method covering the whole process of laser driver construction is proposed to ensure the safe operation of high-power solid-state laser driver. The technical means for improving cleanliness level including high pressure washing, cleanliness detection and protection are described, and a technical approach is proposed for improving cleanliness of the slab amplifiers of SG-Ⅲ laser driver. The illuminating cleaning experiment by flashlamp light is introduced. The results indicate that the cleanliness of SG-Ⅲ laser driver is close to NIF, and better than other similar devices.