Volume 25 Issue 08
Nov.  2013
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Li Zefu, Fang Yu, Luo Xuan, et al. Controlled preparation of SiO2 particles in T-junction microchannel by simulation and experiment[J]. High Power Laser and Particle Beams, 2013, 25: 1956-1960. doi: 10.3788/HPLPB20132508.1956
Citation: Li Zefu, Fang Yu, Luo Xuan, et al. Controlled preparation of SiO2 particles in T-junction microchannel by simulation and experiment[J]. High Power Laser and Particle Beams, 2013, 25: 1956-1960. doi: 10.3788/HPLPB20132508.1956

Controlled preparation of SiO2 particles in T-junction microchannel by simulation and experiment

doi: 10.3788/HPLPB20132508.1956
  • Received Date: 2012-12-21
  • Rev Recd Date: 2013-03-25
  • Publish Date: 2013-06-19
  • A numerical simulation was processed to investigate the main factors of droplet diameter formatted in the T-junction microchannel, and to verify from the experiment. The results showed that the main factors influencing droplets diameter were the geometry ratio of discrete phase inlet and the continuous phase inlet (2l10) as well as the velocity ratio (4k16), silicon particles with diameters of 50, 80, 120 m (l=5, k=4, 6, 10) reached spherical degree above 93%, monodispersity, CV5% of statistics. In conclusion, the numerical simulation and experiment were in good consistency.
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