Transverse emittance measurement of high-current single pulse beams using pepper-pot method

Ke Jianlin; Zhou Changgeng; Qiu Rui

doi:10.3788/HPLPB20132508.2067

Volume 25 Issue 08

Nov. 2013

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Wang Xi, Xiao Shali, Li Miao, et al. Further polarization effect of CdZnTe detectors under high flux X-ray irradiation[J]. High Power Laser and Particle Beams, 2013, 25: 773-777. doi: 10.3788/HPLPB20132503.0773

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Ke Jianlin, Zhou Changgeng, Qiu Rui. Transverse emittance measurement of high-current single pulse beams using pepper-pot method[J]. High Power Laser and Particle Beams, 2013, 25: 2067-2070. doi: 10.3788/HPLPB20132508.2067

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Transverse emittance measurement of high-current single pulse beams using pepper-pot method

doi: 10.3788/HPLPB20132508.2067

1.
Institute of Nuclear Physics and Chemistry,CAEP,P.O.Box 919-213,Mianyang 621900,China

Received Date: 2012-12-17
Rev Recd Date: 2013-01-31
Publish Date: 2013-06-19

Abstract

Abstract

A pepper pot-imaging plate system has been developed and used to measure the 4-D transverse emittance of a vacuum arc ion source. Single beam pulses of tens to hundreds milliamperes were extracted from the plasma with 64 kV high voltage. An imaging plate was laid after the pepper pot to visualize the ion beamlets passing though the holes on the pepper pot. An application program was developed to show the phase-space distribution and calculate the ellipse and RMS emittances. The normalized RMS emittances are about 6.41 mmmrad in x-direction and 4.61 mmmrad in y-direction. It is shown that the emittance of the vacuum arc ion source is much larger than that of other types of ion sources, which is mainly attributed to the high current and the convex meniscus of this source.
- emittance measurement,
- vacuum arc ion source,
- pepper pot,
- single pulse beam

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