Volume 25 Issue 08
Nov.  2013
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Liu Qi, Zhou Weijian, Hou Xiaolin, et al. Accelerator mass spectrometry analysis of 129I[J]. High Power Laser and Particle Beams, 2013, 25: 2085-2090. doi: 10.3788/HPLPB20132508.2085
Citation: Liu Qi, Zhou Weijian, Hou Xiaolin, et al. Accelerator mass spectrometry analysis of 129I[J]. High Power Laser and Particle Beams, 2013, 25: 2085-2090. doi: 10.3788/HPLPB20132508.2085

Accelerator mass spectrometry analysis of 129I

doi: 10.3788/HPLPB20132508.2085
  • Received Date: 2012-08-02
  • Rev Recd Date: 2013-01-10
  • Publish Date: 2013-06-19
  • Ion source is the key part of an Accelerator Mass Spectrometry (AMS) in view of analytical sensitivity, stability and accuracy. SO-110 Cs+ sputtering ion source developed by High Voltage Engineering Europe, is dedicated to AMS for both solid and gas target sources, which has been successfully applied to AMS instruments including one installed in Xian AMS center. By investigation of the effect of various parameters, such as the target preparation, holder characteristics, matrix selection and the ratio between AgI and matrix on AMS measurement of 129I using SO-110 ion source, Cu is the suitable holder material, and Nb powder is the best matrix, and the optimal ratio of AgI∶Nb is 1∶3. A machine background of 1.5210-14 for 129I/127I was obtained using a NaI sample directly mixed with Nb powder and pressed in Cu target holder.
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