Volume 25 Issue 08
Nov.  2013
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Li Mo, Wang Liangping. Improvement on resistive bolometer for measuring total soft X-ray yield generated by Z-pinches[J]. High Power Laser and Particle Beams, 2013, 25: 2142-2146. doi: 10.3788/HPLPB20132508.2142
Citation: Li Mo, Wang Liangping. Improvement on resistive bolometer for measuring total soft X-ray yield generated by Z-pinches[J]. High Power Laser and Particle Beams, 2013, 25: 2142-2146. doi: 10.3788/HPLPB20132508.2142

Improvement on resistive bolometer for measuring total soft X-ray yield generated by Z-pinches

doi: 10.3788/HPLPB20132508.2142
  • Received Date: 2012-11-23
  • Rev Recd Date: 2013-03-07
  • Publish Date: 2013-06-19
  • The resistive bolometer is an accurate, robust, spectrally broadband technique for measuring total soft X-ray yield. By replacing the pulsed voltage driver with a pulsed current driver and removing the series-wound resistance, the change of resistance between the ends of Ni-film can be measured directly, thus the measurement precision can be promoted effectively. The applicability of this improved resistive bolometer is expanded to all typical Z-pinch loads on Qiangguang-Ⅰ facility. Data analysis shows that the uncertainty decreases from 49.0% to 19.6% in measuring X-ray yield generated by Al wire array Z-pinches. X-ray yield data from the resistive bolometer were compared with the ones from the X-ray power measure system. The ratios between them were between 0.87 and 1.04.
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