Development of measurement system for radiation effects on synchronous dynamic random access memory

Yao Zhibin; Luo Yihong; Chen Wei; He Baoping; Zhang Fengqi; Guo Hongxia

doi:10.3788/HPLPB20132510.2699

Volume 25 Issue 10

Sep. 2013

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Article Navigation > High Power Laser and Particle Beams > 2013 > 25(10): 2699-2704

Lu Bin, Cui Bohua. Analysis and design of terahertz waveguide filter[J]. High Power Laser and Particle Beams, 2013, 25: 1527-1529. doi: 10.3788/HPLPB20132506.1527

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Yao Zhibin, Luo Yihong, Chen Wei, et al. Development of measurement system for radiation effects on synchronous dynamic random access memory[J]. High Power Laser and Particle Beams, 2013, 25: 2699-2704. doi: 10.3788/HPLPB20132510.2699

Lu Bin, Cui Bohua. Analysis and design of terahertz waveguide filter[J]. High Power Laser and Particle Beams, 2013, 25: 1527-1529. doi: 10.3788/HPLPB20132506.1527

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Development of measurement system for radiation effects on synchronous dynamic random access memory

doi: 10.3788/HPLPB20132510.2699

1.
Northwest Institute of Nuclear Technology,Xi’an 710024,China

Received Date: 2012-12-14
Rev Recd Date: 2013-05-04
Publish Date: 2013-09-22

Abstract

Abstract

An online measurement system for radiation effects on synchronous dynamic random access memory (SDRAM) is developed on the basis of the analysis of the main failure phenomenon, which can test the function, refresh period and power supply current. The results of an experiment on SDRAM for total ionizing dose effect (TID) show that the TID can cause the decrease in data retention time, the increase in power supply current and the functional failure. For the samples MT48LC8M32B2, its functional failure is caused by the peripheral control circuits, rather than the memory unit upset. Data retention time keeps decreasing with the increase of the total dose, but this is not the directive reason for the functional failure of SDRAM.
- synchronous dynamic random access memory,
- radiation effects,
- measurement system,
- refresh period,
- total ionizing dose effects

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