Transient X-ray diffraction to diagnose elastic deformation of shocked lithium fluoride single crystal

Wang Hairong; Xiao Shali; Yang Qingguo; Ye Yan; Li Mu; Li Jun; Peng Qixian; Li Zeren

doi:10.3788/HPLPB201426.024004

Volume 26 Issue 02

Jan. 2014

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Article Navigation > High Power Laser and Particle Beams > 2014 > 26(02): 024004

Yu Binxiong, Liu Jinliang. Calculation of secondary capacitance of compact Tesla pulse transformer[J]. High Power Laser and Particle Beams, 2013, 25: 1821-1825. doi: 10.3788/HPLPB20132507.1821

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Wang Hairong, Xiao Shali, Yang Qingguo, et al. Transient X-ray diffraction to diagnose elastic deformation of shocked lithium fluoride single crystal[J]. High Power Laser and Particle Beams, 2014, 26: 024004. doi: 10.3788/HPLPB201426.024004

Yu Binxiong, Liu Jinliang. Calculation of secondary capacitance of compact Tesla pulse transformer[J]. High Power Laser and Particle Beams, 2013, 25: 1821-1825. doi: 10.3788/HPLPB20132507.1821

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Transient X-ray diffraction to diagnose elastic deformation of shocked lithium fluoride single crystal

doi: 10.3788/HPLPB201426.024004

1.
Institute of Fluid Physics,CAEP,P.O.Box 919-109,Mianyang 621900,China;
2.
Key Laboratory of Optoelectronic Technology and System Chongqing University,Ministry of Education,Chongqing 400030,China

Received Date: 2013-07-16
Rev Recd Date: 2013-11-01
Publish Date: 2014-02-15

Abstract

Abstract

Transient X-ray diffraction was used to diagnose the elastic deformation of the LiF single crystal which was shocked along the ［100］ direction. The experiment was implemented in Shenguang Ⅱ. High-intensity lasers irradiated a thin Cu foil to generate helium-like rays as X-ray source, another laser beam irradiated LiF single crystal which was 7 mm7 mm in size, 300 m in thickness as the shocked source. Image plate recorded the shocked diffraction signal of the lattice plane (200) as well as the unshocked signal. The experimental results show that the crystal lattice is compressed, lattice spacing in (200) decreases to result in shifting upwards. The positions of the diffraction lines associated with the (200) lattice plane indicate the compression along ［100］ direction by 11%. Whats more, the results show that it is useful for diagnosing the microscopic dynamic response of the material by transient X-ray diffraction.
- transient X-ray diffraction,
- single crystal LiF,
- shock compression,
- elastic deformation,
- image plate

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