Luo Jin, Liu Zhichao, Chen Songlin, et al. Theoretical research of multi-pulses laser induced damage in dielectrics[J]. High Power Laser and Particle Beams, 2013, 25: 3301-3306. doi: 3301
Citation:
Luo Jin, Liu Zhichao, Chen Songlin, et al. Theoretical research of multi-pulses laser induced damage in dielectrics[J]. High Power Laser and Particle Beams, 2013, 25: 3301-3306. doi: 3301
Luo Jin, Liu Zhichao, Chen Songlin, et al. Theoretical research of multi-pulses laser induced damage in dielectrics[J]. High Power Laser and Particle Beams, 2013, 25: 3301-3306. doi: 3301
Citation:
Luo Jin, Liu Zhichao, Chen Songlin, et al. Theoretical research of multi-pulses laser induced damage in dielectrics[J]. High Power Laser and Particle Beams, 2013, 25: 3301-3306. doi: 3301
The pulse width is different, the mechanism of the laser-matter interaction is different. Damage results from plasma formation and ablation for10 ps and from heat depositing and conventional melting for >100 ps. Two theoretical models of transparent dielectrics irradiated by multi-pulses laser are respectively developed based on the above-mentioned different mechanism. One is the dielectric breakdown model based on electron density evolution equation for femtosecond multi-pluses laser, the other is the dielectric heat-damage model based on Fouriers heat exchange equation for nanosecond multi-pluses laser. Using these models, the effects of laser parameters and material parameters on the laser-induced damage threshold of dielectrics are analyzed. The analysis results show that different parameters have different influence on the damage threshold. The effect of parameters on the multi -pulses damage threshold is not entirely the same to the single-pulse damage threshold. The multi-pulses damage mechanism of dielectrics is discussed in detail, considering the effect of different parameters. The discussion provides more information for understanding its damage process and more knowledge to improve its damage thresholds. And the relationship between damage threshold and pulse number is illustrated, it is in good agreement with experimental results. The illustration can help us to predict the multi-pulses damage threshold and the lifetime of optical components.