Simulation calculation for the energy deposition profile and the transmission fraction of intense pulsed electron beamat various incident angles

yang hai-liang; qiu ai-ci; zhang jia-sheng; huang jian-jun; sun jian-feng

Volume 14 Issue 05

Oct. 2002

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Article Navigation > High Power Laser and Particle Beams > 2002 > 14(05): 0-

xiao shali, li miao, wang xi, et al. Accumulated-carrier screening effect based investigation for pixellated CdZnTe radiation detector[J]. High Power Laser and Particle Beams, 2011, 23.

Citation:

yang hai-liang, qiu ai-ci, zhang jia-sheng, et al. Simulation calculation for the energy deposition profile and the transmission fraction of intense pulsed electron beamat various incident angles[J]. High Power Laser and Particle Beams, 2002, 14.

xiao shali, li miao, wang xi, et al. Accumulated-carrier screening effect based investigation for pixellated CdZnTe radiation detector[J]. High Power Laser and Particle Beams, 2011, 23.

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Simulation calculation for the energy deposition profile and the transmission fraction of intense pulsed electron beamat various incident angles

1.
Northwest Institute of Nuclear Technology,P.O.Box 69-10,Xi′an 710024,China

Publish Date: 2002-10-15

Abstract

Abstract

The incident angles have a heavy effect on the intense pulsed electr on beam energy deposition profile, energy deposition fraction and beam current transmission fraction in material. This article presents electron beam energy deposition profile and energy deposition fraction versus electron energy(0.5-2.0MeV), at various incident angles for three aluminum targets of various thickness via theoretical calculation. The intense pulsed electron beam current transmission fractions versus electron energy(0.4-1.4MeV) at various incident a ngles for three thickness of carbon targets were also theoretically calculated. The calculation results indicate that the deposition energy in unit mass of material surface layer increases with the rise of electron beam incident angle, and electron beam with low
- electron beam,
- incident angle,
- electron transport,
- energy deposition,
- current transmission fraction

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