Reliability assessment of metallized film capacitors using degradation failure model

zhao jian-yin; liu fang; sun quan; zhou jing-lun; wei xiao-feng; he shao-bo

Volume 17 Issue 07

Jul. 2005

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Abstract

References

Article Navigation > High Power Laser and Particle Beams > 2005 > 17(07): 0-

li shi, liu wei, su xiao-bao, et al. Method of simulation on coupled cavity slow wave structure cold-test characteristic[J]. High Power Laser and Particle Beams, 2005, 17.

Citation:

zhao jian-yin, liu fang, sun quan, et al. Reliability assessment of metallized film capacitors using degradation failure model[J]. High Power Laser and Particle Beams, 2005, 17.

li shi, liu wei, su xiao-bao, et al. Method of simulation on coupled cavity slow wave structure cold-test characteristic[J]. High Power Laser and Particle Beams, 2005, 17.

Citation:

zhao jian-yin, liu fang, sun quan, et al. Reliability assessment of metallized film capacitors using degradation failure model[J]. High Power Laser and Particle Beams, 2005, 17.

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Reliability assessment of metallized film capacitors using degradation failure model

1.
School of Information System and Management,National University of Defense Technology,Changsha 410073,China;
2.
Research Center of Laser Fusion,CAEP,P.O.Box 919-988,Mianyang 621900,China

Publish Date: 2005-07-15

Abstract

Abstract

The metallized film pulse capacitor is a key component of the inertial confinement laser fusion facility. For the high reliability capacitors, it is difficult to assess the reliability by using the traditional time-to-failure analysis method. By analyzing degradation mechanism of the metallized film capacitor, this paper presents a degradation failure model in which parameters can be estimated from the performance degradation measures of the capacitor. The estimation values of the unknown parameters in this model are 0.000 119 4 and 0.006 7, respectively. Both the failure probability density function (PDF) and the cumulative distribution function (CDF) can be presented by this degradation failure model. Based on these estimation values and the PDF/CDF, the reliability model of the metalliz
- degradation failure,
- reliability,
- metallized film capacitors,
- probability density function(pdf),
- cumulative distribution function (cdf)

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