Reliability assessment of metallized film capacitors using degradation failure model

The metallized film pulse capacitor is a key component of the inertial confinement laser fusion facility. For the high reliability capacitors, it is difficult to assess the reliability by using the traditional time-to-failure analysis method. By analyzing degradation mechanism of the metallized film capacitor, this paper presents a degradation failure model in which parameters can be estimated from the performance degradation measures of the capacitor. The estimation values of the unknown parameters in this model are 0.000 119 4 and 0.006 7, respectively. Both the failure probability density function (PDF) and the cumulative distribution function (CDF) can be presented by this degradation failure model. Based on these estimation values and the PDF/CDF, the reliability model of the metalliz