Time-resolved measurement system for electron beam profile of high current LIA

The beam parameters of high energy and high current LIA are very important for the debugging work. For its ultra-fast response and high resolution, OTR is used to measure both spatial and angular profiles of an electron beam. A time-resolved measurement result of an electron beam produced by LIA can provide much more detailed information．Such a time-resolved measurement system for electron beam profile using OTR has been developed recently in the Institute of Fluid Physics of CAEP and has been put into practice. Typical time-resolved measurement results of an electron beam produced by 12 MeV LIA are shown in the paper. Many phenomena are observed for the first time. This system can capture 8 frame images at a time in the minimum time interval of 10ns while the exposure time is 3 ns．The f