Volume 18 Issue 01
Jan.  2006
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pan ning-ning, wang zhan-shan, gu chun-shi, et al. Image quality with Kirkpatrick-Baez microscope in hard X-ray[J]. High Power Laser and Particle Beams, 2006, 18.
Citation: pan ning-ning, wang zhan-shan, gu chun-shi, et al. Image quality with Kirkpatrick-Baez microscope in hard X-ray[J]. High Power Laser and Particle Beams, 2006, 18.

Image quality with Kirkpatrick-Baez microscope in hard X-ray

  • Publish Date: 2006-01-15
  • An important diagnosis method——Kirkpatrick-Baez microscope system in ICF experiments was researched. The brief aberration of the Kirkpatrick-Baez microscope was calculated. The main aberration, spherical aberration was analyzed, and the spherical aberration is 94% of the total aberration. The configuration was simulated by the ray tracing method. Resolutions in different fields and mirror-lengths were compared. The modal of Kirkpatrick-Baez microscope was made in computer with 10 μm resolutionat 8 keV. It was studied about the adjusting tolerance method of Kirkpatrick-Baez microscope. When numerical aperture is 0.003 7, the angle error range is -0.087°~0.067°。
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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