Gated integrator method in the calibration of photoconductive detector

To calibrate photoconductive detectors with the synchrotron soft X-ray source, a new method based on gated integration has been proposed. It will replace the high sensitive measurement system based on high performance oscilloscopes and improve the preamplifier, of which the band reaches 2.9 GHz. The sensitivity of the gated integrator is 2.8×10-18 C/bit . The sensitivity dynamic calibration of the diamond detector has been completed at the Beijing Synchrotron Radiation Facility (BSRF) using the new method. A better signal noise rate has been got on the C,Al,Ni,Fe thin filter. The results of the test show that the sample detector is more sensitive on long wave band (50～280 eV) and this method is feasible in principle.