yuan yong-teng, miao wen-yong, ding yong-kun, et al. Observation of growth of rear surface perturbation caused by ablation surface[J]. High Power Laser and Particle Beams, 2007, 19.
Citation:
yuan yong-teng, miao wen-yong, ding yong-kun, et al. Observation of growth of rear surface perturbation caused by ablation surface[J]. High Power Laser and Particle Beams, 2007, 19.
yuan yong-teng, miao wen-yong, ding yong-kun, et al. Observation of growth of rear surface perturbation caused by ablation surface[J]. High Power Laser and Particle Beams, 2007, 19.
Citation:
yuan yong-teng, miao wen-yong, ding yong-kun, et al. Observation of growth of rear surface perturbation caused by ablation surface[J]. High Power Laser and Particle Beams, 2007, 19.
Sideon radiography technology can directly demonstrate the change of perturbation amplitude on target surface. In the experiment at Shenguang Ⅱ laser facility, this technology is used to detect rear surface perturbation caused by the ablation surface perturbation. The perturbation amplitude observed in the experiment is higher than expected. According to our analysis, twodimension effect is the main reason for larger perturbation growth of the rear surface. Because X ray mainly irradiates the center of the ablation surface, the rear surface perturbation, which is caused by the ablation surface perturbation, exists in the center and gradually spreads around. Based on above discussion, an optimized target design is presented at last, which suggests the target size along the direction of