Volume 19 Issue 11
Nov.  2007
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liu xing-hua, wu wei-dong, he zhi-bing, et al. Roughness and optical properties of α-C:H films[J]. High Power Laser and Particle Beams, 2007, 19.
Citation: liu xing-hua, wu wei-dong, he zhi-bing, et al. Roughness and optical properties of α-C:H films[J]. High Power Laser and Particle Beams, 2007, 19.

Roughness and optical properties of α-C:H films

  • Publish Date: 2007-11-15
  • α-C:H thin films were deposited by low-pressure plasma enhanced chemical vapor deposition(LPPCVD) with H2 and Trans-2-butene as source gases. Atomic force microscope and scanning electron microscope images demonstrated the surface morphology of the films deposited under different T2B/H2 flow ratios and pressure. It was found that the root-mean-square roughness was 0.97 nm when the T2B/H2 flow ratio and pressure were 4 and 15 Pa respectively. The FTIR spectrum showed that the structure and composition of the films change with the T2B/H2 flow ratios, and this films mainly contain sp3C—H bonds, which have low T2B/H2 flow ratio and possess more C=C bonds. The UV-VIS spectrum showed that the transmission ratios can reach 98% in the visible light range, the films have strong absorption in the
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