lu bin-xian, luo yan-hua, zhang xian-jun, et al. Research on probability distribution of coupling responses of transmission lines externally excited by electromagnetic field[J]. High Power Laser and Particle Beams, 2008, 20.
Citation:
lu bin-xian, luo yan-hua, zhang xian-jun, et al. Research on probability distribution of coupling responses of transmission lines externally excited by electromagnetic field[J]. High Power Laser and Particle Beams, 2008, 20.
lu bin-xian, luo yan-hua, zhang xian-jun, et al. Research on probability distribution of coupling responses of transmission lines externally excited by electromagnetic field[J]. High Power Laser and Particle Beams, 2008, 20.
Citation:
lu bin-xian, luo yan-hua, zhang xian-jun, et al. Research on probability distribution of coupling responses of transmission lines externally excited by electromagnetic field[J]. High Power Laser and Particle Beams, 2008, 20.
Based on the nodal admittance method which is convenient to analyze the responses at terminals of multiconductor transmission lines excited by EM field, Mento Carlo method for the characterization of wiring-harness susceptibility to external interference was applied. Field-coupling onto two-conductor transmission line and multiconductor transmission line loaded by terminal resistances were considered. The external field was modeled by a plane wave with random parameters as polarization angle, incident angle and azimuth angle generated by computer. The response formulas of two-conductor and multiconductor line were applied, and the peak value of voltages or currents was computed for every set of random values. For incident parameter range of [0, p/2], the probability distributions of term