Volume 20 Issue 06
Jun.  2008
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li hang, cao zhu-rong, zhao zong-qing, et al. Calibration of 2~5.5 keV X-ray transmissivity of microchannel plate[J]. High Power Laser and Particle Beams, 2008, 20.
Citation: li hang, cao zhu-rong, zhao zong-qing, et al. Calibration of 2~5.5 keV X-ray transmissivity of microchannel plate[J]. High Power Laser and Particle Beams, 2008, 20.

Calibration of 2~5.5 keV X-ray transmissivity of microchannel plate

  • Publish Date: 2008-06-15
  • MCP transmissivity is calibrated on the 3B3 medium energy X-ray beamline in BSRF from 2.0~5.5 keV. The experimental result unveils that the transmissivity shrinks steeply from 2.0~3.5 keV, and reaches the bottom from 3.5~4.5 keV,then swells from 4.5~5.5 keV. MCP transmissivity near the two ends of low-energy 2 keV and high-energy 5.5 keV is higher than that at the middle part. Reflection and transmission are calculated in the pores array of MCP respectively. The grazing incident X-ray in pores results in total reflection, and the reflectivity rises as the X-ray energy falls, which successfully explains the peculiar phenomena of high transmissivity in low energy. Characteristic of MCP transmissivity is resulted from peculiar structure and material of the MCP, and is contributed together by
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