Experimental study on Langmuir probe diagnosis of plasma based on  data acquisition system

li a-hong; yan yang; wang bin; gao xin-yan; xie wen-kai

Volume 20 Issue 08

Aug. 2008

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Article Navigation > High Power Laser and Particle Beams > 2008 > 20(08): 0-

hou li-fei, yi rong-qing, du hua-bing, et al. Structure design and finite-element analysis of multilayer-mirror soft X-ray energy spectrometer[J]. High Power Laser and Particle Beams, 2008, 20.

Citation:

li a-hong, yan yang, wang bin, et al. Experimental study on Langmuir probe diagnosis of plasma based on data acquisition system[J]. High Power Laser and Particle Beams, 2008, 20.

hou li-fei, yi rong-qing, du hua-bing, et al. Structure design and finite-element analysis of multilayer-mirror soft X-ray energy spectrometer[J]. High Power Laser and Particle Beams, 2008, 20.

Citation:

li a-hong, yan yang, wang bin, et al. Experimental study on Langmuir probe diagnosis of plasma based on data acquisition system[J]. High Power Laser and Particle Beams, 2008, 20.

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Experimental study on Langmuir probe diagnosis of plasma based on data acquisition system

1.
School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,China

Publish Date: 2008-08-15

Abstract

Abstract

Many parameters of plasma, such as electron temperature and ion density can be calculated according to the voltage-curren characteristics curve measured by Langmuir probe. A plasma scanning power system and a data acquisition system are applied in this experiment which could acquire, save, analyze and display data in real time. The data acquisition system is a virtual instrument system, composed of three sections as data acquisition, analysis and results display. It is used to acquire the Langmuir probe’s current and voltage signals, as well as analyse and process them. The entire testing process finishes in time of ms level. Compared with meanual test, Langmuir probe test based on data acquistion system could gain more accurate data in a larger voltage range(-100~100 V). Moreover, it can
- langmuir probe,
- plasma,
- electron temperature,
- ion density,
- data acquisition system

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