Volume 20 Issue 08
Aug.  2008
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zhang hui-ge, wang zhe-bin, yang cun-bang, et al. Linearity slope and nonlinear scale for CCD sampling and collecting system[J]. High Power Laser and Particle Beams, 2008, 20.
Citation: zhang hui-ge, wang zhe-bin, yang cun-bang, et al. Linearity slope and nonlinear scale for CCD sampling and collecting system[J]. High Power Laser and Particle Beams, 2008, 20.

Linearity slope and nonlinear scale for CCD sampling and collecting system

  • Publish Date: 2008-08-15
  • As one of the most important feartures of CCD, linearity can have great influence on data analysis especially in the region of quantitative calculations. The experimental research on the linearity slope and nonlinear scale of scientific optical CCD related to the application in the ICF field is comprehensively carried out by the maximal deviation method, which shows that the system gain of CCD is dependent on the type of ADC(analog to digital converter) but not on its readout rate and the nonlinear scale is less than 1% when the count is less than 15% of full scale. The calibrated data will be used as the basis of quantitatve calculation and analysis related to our ICF research.
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