pang qi-long, chen ming-jun, wang jing-he, et al. Fractal analysis on topography of KDP surfaces by single point diamond tools method[J]. High Power Laser and Particle Beams, 2007, 19.
Citation:
guo linhui, tang chun, wu deyong, et al. Measurement of “smile” for high-power diode laser array[J]. High Power Laser and Particle Beams, 2009, 21.
pang qi-long, chen ming-jun, wang jing-he, et al. Fractal analysis on topography of KDP surfaces by single point diamond tools method[J]. High Power Laser and Particle Beams, 2007, 19.
Citation:
guo linhui, tang chun, wu deyong, et al. Measurement of “smile” for high-power diode laser array[J]. High Power Laser and Particle Beams, 2009, 21.
Diode laser array curvature “smile” produced in the packaging process affects the lasering characteristics, life and beam quality of lasers. Using uniaxial amplification system composed of a high-resolution CCD, a fast axis collimation lens and cylindrical lenses, via laser emitters imaging and facula intensity-based centroid algorithm, the “smile” of diode laser array is measured. The experimental results show that: in the vicinity of threshold current, “smile” of the diode laser array with In solder is less than 2 μm. Influences of FAC lens and CCD resolution on the results are analyzed.
pang qi-long, chen ming-jun, wang jing-he, et al. Fractal analysis on topography of KDP surfaces by single point diamond tools method[J]. High Power Laser and Particle Beams, 2007, 19.
pang qi-long, chen ming-jun, wang jing-he, et al. Fractal analysis on topography of KDP surfaces by single point diamond tools method[J]. High Power Laser and Particle Beams, 2007, 19.
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