Theoretical study of deflection-scan subsystem of femtosecond electron diffraction system based on relativistic correction

wu jianjun; tian jinshou; zhao baosheng; zhang jie

Volume 21 Issue 03

Mar. 2009

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Article Navigation > High Power Laser and Particle Beams > 2009 > 21(03): 0-

wu jianjun, tian jinshou, zhao baosheng, et al. Theoretical study of deflection-scan subsystem of femtosecond electron diffraction system based on relativistic correction[J]. High Power Laser and Particle Beams, 2009, 21.

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Theoretical study of deflection-scan subsystem of femtosecond electron diffraction system based on relativistic correction

1.
Wuxi Institute of Commerce,Wuxi 214153,China;
2.
Xi’an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi’an 710068,China;
3.
Institute of Physics,Chinese Academy of Sciences,Beijing 100080,China

Publish Date: 2009-03-15

Abstract

Abstract

The deflection-scan subsystem of the femtosecond electron diffraction system was theoretically studied and an exact solution of the deflection distance was got. The numerical calculations under relativistic correction and non-relativistic correction show that the difference of the deflection distances is about 61.4 mm, and the difference of the electron pulse widths is about 65 fs. The result can be useful for the design of the subsystem and the test of the time resolution of the ultra-fast electron diffraction system, especially for the synchronization process of the test.
- femtosecond laser,
- ultra-fast electron diffraction,
- deflection and scanning system,
- relativistic correction

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