Volume 21 Issue 05
May  2009
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peng qiangxiang, li zhijie, zu xiaotao. Preparation and optical properties of SiO2 stablized SnO2 quantum dot films[J]. High Power Laser and Particle Beams, 2009, 21.
Citation: peng qiangxiang, li zhijie, zu xiaotao. Preparation and optical properties of SiO2 stablized SnO2 quantum dot films[J]. High Power Laser and Particle Beams, 2009, 21.

Preparation and optical properties of SiO2 stablized SnO2 quantum dot films

  • Publish Date: 2009-05-15
  • quantum dot SiO2 stabilized SnO2 quantum dot were prepared by sol-gel-hydrothermal process. Then SnO2 quantum dot thin films were obtained by spin-coating with preprocess of well dispersing SnO2 quantum dots in SiO2 sol. The as-prepared SnO2 quantum dots showed tetragonal rutile crystal structure and quantum dot radius of about 4.0 nm. The optical band gap of the thin films was derived from UV-vis transmission spectra, with value of about 3.96 eV. The SnO2 quantum dot thin films showed multi-peak photoluminescence properties at room temperature, mainly excitation emission at 356 nm and defect emission at 388 nm.
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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