Digital detection system of surface defects for large aperture optical elements

fan yong; chen niannian; gao lingling; jia yuan; wang junbo; cheng xiaofeng

Volume 21 Issue 07

Jul. 2009

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Abstract

References

Article Navigation > High Power Laser and Particle Beams > 2009 > 21(07): 0-

guo ruhai, shi kui, wang hengkun, et al. Damage in optical components induced by high power semiconductor laser[J]. High Power Laser and Particle Beams, 2011, 23.

Citation:

fan yong, chen niannian, gao lingling, et al. Digital detection system of surface defects for large aperture optical elements[J]. High Power Laser and Particle Beams, 2009, 21.

guo ruhai, shi kui, wang hengkun, et al. Damage in optical components induced by high power semiconductor laser[J]. High Power Laser and Particle Beams, 2011, 23.

Citation:

fan yong, chen niannian, gao lingling, et al. Digital detection system of surface defects for large aperture optical elements[J]. High Power Laser and Particle Beams, 2009, 21.

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Digital detection system of surface defects for large aperture optical elements

1.
School of Computer Science and Technology,Southwest University of Science Technology,Mianyang 621010,China;
2.
School of Defense Technology,Southwest University of Science Technology,Mianyang 621010,China;
3.
Research Center of Laser Fusion,CAEP,P.O.Box 919-988,Mianyang 621900,China

Publish Date: 2009-07-15

Abstract

Abstract

Based on the light defect images against the dark background in a scattering imaging system, a digital detection system of surface defects for large aperture optical elements has been presented. In the system, the image is segmented by a multi-area self-adaptive threshold segmentation method, then a pixel labeling method based on replacing arrays is adopted to extract defect features quickly, and at last the defects are classified through back-propagation neural networks. Experiment results show that the system can achieve real-time detection and classification.
- icf,
- defect,
- fast labeling algorithm,
- feature parameter,
- classification rule

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