Automated defect recognition method based on neighbor layer slice images of ICT

The current automated defect recognition of industrial computerized tomography(ICT) slice images is mostly carried out in individual image. Certain false detections would exist for some isolated noises can not be wiped off without considering the information of neighbor layer images. To solve this problem, a new automated defect recognition method is presented based on a two-step analysis of consecutive slice images. First, all potential defects are segmented using a classic method in each image. Second, real defects and false defects are recognized by all potential defect matching of neighbor layer images in two steps based on the continuity of real defects characteristic and the non-continuity of false defects between the neighbor images. The method is verified by experiments and result