cheng yuan-li, zhao yong peng, song jian-wei, et al. A flatfield XUV spectrograph with 30～50nm flat region[J]. High Power Laser and Particle Beams, 2003, 15.
Citation:
cheng yuan-li, zhao yong peng, song jian-wei, et al. A flatfield XUV spectrograph with 30～50nm flat region[J]. High Power Laser and Particle Beams, 2003, 15.
cheng yuan-li, zhao yong peng, song jian-wei, et al. A flatfield XUV spectrograph with 30～50nm flat region[J]. High Power Laser and Particle Beams, 2003, 15.
Citation:
cheng yuan-li, zhao yong peng, song jian-wei, et al. A flatfield XUV spectrograph with 30～50nm flat region[J]. High Power Laser and Particle Beams, 2003, 15.
A flat-field spectrograph with a toroidal mirror at 747.4 mm incident distance was designed that can provide 30～50nm flat field and better space resolution. XUV spectrum from a hollow cathode gaseous discharge source filled with He gas was measured using this flatfield spectrograph. The spectrograph system can produce a space-resolved spectral images with spectral resolution of 0.001 around 30nm with 0.1mm the incident slit. The spectrograph system will be used to detect the XUV emission from capillary discharge plasma.
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