Data processing for elliptical crystal spectrometer used in Z-pinch diagnostic

Elliptical crystal spectrometers are key instruments to detect the line spectra of soft X-rays in Z-pinch diagnostics. This paper deals with the data processing for an elliptical crystal spectrometer. Taking the diagnostic results obtained in a neon gas-puff Z-pinch experiment as an example, the detailed processes, such as changing the optical density to X-ray intensity according a calibrated film response curve, determining the X-ray energy of the measured spectrum using the energy and the order number of scanned point of identified spectral lines, and correcting the intensity of spectrum using the formula given by Henke are discussed. In the Henke’s formula, the effect of nonuniform dispersion, integrated reflectivity of crystals and transmission of X-ray filters are considered. The fin