Gamma source imaging based on pixellated CdZnTe detection

li miao; xiao shali; zhang liuqiang; cao yulin; chen yuxiao; shen min; wang xi

Volume 22 Issue 09

Aug. 2010

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Abstract

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Article Navigation > High Power Laser and Particle Beams > 2010 > 22(09): 0-

Ma Hongyu, Han Yiping. Magnetic guiding of cold atoms in radio-frequency waveguide[J]. High Power Laser and Particle Beams, 2012, 24: 1754-1756.

Citation:

li miao, xiao shali, zhang liuqiang, et al. Gamma source imaging based on pixellated CdZnTe detection[J]. High Power Laser and Particle Beams, 2010, 22.

Ma Hongyu, Han Yiping. Magnetic guiding of cold atoms in radio-frequency waveguide[J]. High Power Laser and Particle Beams, 2012, 24: 1754-1756.

Citation:

li miao, xiao shali, zhang liuqiang, et al. Gamma source imaging based on pixellated CdZnTe detection[J]. High Power Laser and Particle Beams, 2010, 22.

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Gamma source imaging based on pixellated CdZnTe detection

1.
Key Laboratory of Optoelectronic Technology and System of Ministry of Education,Chongqing University,Chongqing 400030,China;
2.
Institute of Electronic Engineering,CAEP,P.O.Box 919-512,Mianyang 621900,China

Publish Date: 2010-08-17

Abstract

Abstract

A gamma source pinhole imaging system with direct imaging mode pixellated CdZnTe detector has been constructed based on the principle of pinhole imaging. The energy resolution and peak efficiency of CdZnTe pixellated detector were tested and analyzed. During the preliminary experiments, modulation transfer function (MTF) and additional noise characteristic of pinhole imaging system were investigated and discussed. This paper presents and evaluates the test images of a 0.5 mm diameter 137Cs gamma source. The measured pinhole images are restored with the Lucy-Richardson algorithm. The energy resolution of the CdZnTe pixellated detector system for 662 keV 137Cs are 6.25%～7.50% and photon peak efficiency are 65.0%～72.5%. There is lateral spread information in the source
- radiation imaging detection,
- semiconductor detector,
- cdznte,
- pinhole imaging,
- peak efficiency

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