Synergistic effect of neutron and gamma irradiation on 10-bit CMOS digital-to-analog converter

liu yan; yang shanchao; lin dongsheng; cui qinglin; chen wei; gong jiancheng; wang guizhen; bai xiaoyan; guo xiaoqiang

Volume 22 Issue 09

Aug. 2010

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Article Navigation > High Power Laser and Particle Beams > 2010 > 22(09): 0-

liu xin, liu jin-yuan, yang fang, et al. High-voltage pulse generation with MOSFET[J]. High Power Laser and Particle Beams, 2008, 20.

Citation:

liu yan, yang shanchao, lin dongsheng, et al. Synergistic effect of neutron and gamma irradiation on 10-bit CMOS digital-to-analog converter[J]. High Power Laser and Particle Beams, 2010, 22.

liu xin, liu jin-yuan, yang fang, et al. High-voltage pulse generation with MOSFET[J]. High Power Laser and Particle Beams, 2008, 20.

Citation:

liu yan, yang shanchao, lin dongsheng, et al. Synergistic effect of neutron and gamma irradiation on 10-bit CMOS digital-to-analog converter[J]. High Power Laser and Particle Beams, 2010, 22.

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Synergistic effect of neutron and gamma irradiation on 10-bit CMOS digital-to-analog converter

1.
Northwest Institute of Nuclear Technology,P.O.Box 69-10,Xi’an 710024,China;
2.
Sichuan Institute of Solid State Circuits,China Electronics Technology Group Corporation,Chongqing 400060,China

Publish Date: 2010-08-17

Abstract

Abstract

This paper presents the experiment results of the combined irradiation by neutron and gamma ray on SDA9760, a 10-bit CMOS digital-to-analog converter. The electrical and functional tests were conducted in four types of irradiation: neutron, gamma ray, combined irradiation of neutron and gamma ray, and gamma ray after neutron irradiation. The experiment results show that the mixed neutron and gamma irradiation can induce a synergistic effect on the sample, i.e. the increase of total ionizing dose effect. Compared with neutron or gamma ray radiation, the device exhibits considerably severer degradation under neutron and gamma synergistic irradiation.
- synergistic effect,
- mixed neutron and γ environment,
- cmos digital-to-analog converter,
- total ionizing dose effects,
- displacement damage

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