Volume 22 Issue 10
Sep.  2010
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liu lifeng, xiao shali, wang hongjian, et al. Application of spherically bent crystals spectrometer to X-ray diagnosis[J]. High Power Laser and Particle Beams, 2010, 22.
Citation: liu lifeng, xiao shali, wang hongjian, et al. Application of spherically bent crystals spectrometer to X-ray diagnosis[J]. High Power Laser and Particle Beams, 2010, 22.

Application of spherically bent crystals spectrometer to X-ray diagnosis

  • Publish Date: 2010-09-03
  • In order to diagnose X-ray emitted from the plasma, a spherically bent crystals spectrometer was developed based on the X-ray Bragg diffraction theory. In the experiment, the dispersive element of crystal analyzer was quartz, the bent radius was 250 mm and the range of Bragg angle of the crystal was 30° to 67.5°. The X-ray film, as its principal detector, obtained spectra information which had an effective area of 10 mm×50 mm. The experiment was carried out at the anode accelerator. The detector obtained the X-ray spectra information of the K-shell Ti spectra. By the analysis of spectra information, the spectral resolution of spherically bent quartz crystals can be achieved for more than 1 000, and the spectral passband is 0.43 eV.
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