Measurement of femtosecond laser focusing spot by optical imaging and pinhole method

wu yuchi; he yingling; zhu bin; wen tianshu; dong kegong; guo yi; sun li; li qing; wang xiaodong; gu yuqiu

Volume 22 Issue 12

Dec. 2010

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Article Navigation > High Power Laser and Particle Beams > 2010 > 22(12): 0-

xun tao, yang han-wu, zhang jian-de, et al. Design of a ceramic radial insulation structure for a high current diode[J]. High Power Laser and Particle Beams, 2007, 19.

Citation:

wu yuchi, he yingling, zhu bin, et al. Measurement of femtosecond laser focusing spot by optical imaging and pinhole method[J]. High Power Laser and Particle Beams, 2010, 22.

xun tao, yang han-wu, zhang jian-de, et al. Design of a ceramic radial insulation structure for a high current diode[J]. High Power Laser and Particle Beams, 2007, 19.

Citation:

wu yuchi, he yingling, zhu bin, et al. Measurement of femtosecond laser focusing spot by optical imaging and pinhole method[J]. High Power Laser and Particle Beams, 2010, 22.

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Measurement of femtosecond laser focusing spot by optical imaging and pinhole method

1.
National Key Laboratory of Laser Fusion,Research Center of Laser Fusion CAEP,P.O.Box 919-986,Mianyang 621900,China;
2.
Key Laboratory of Basic Plasma Physics,Chinese Academy of Sciences,Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China

Publish Date: 2010-12-07

Abstract

Abstract

For the interaction experiments between ultra-intense laser and targets, characterizing the laser focusing spot is very important. Two different methods were adopted on SILEX-Ⅰ Ti:sappire femtosecond laser system. One is directly imaging the laser spot on 16bit CCD, another is measuring the transmitting energy behind a pinhole which was exactly positioned on the laser focusing spot. Both methods can give the correct distribution of the focal spot with less than error 10%.
- focal spot,
- femtosecond laser,
- laser intensity,
- optical imaging,
- pinhole method

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