wei lai, cao leifeng, fan wei, et al. Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
wei lai, cao leifeng, fan wei, et al. Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray[J]. High Power Laser and Particle Beams, 2011, 23.
wei lai, cao leifeng, fan wei, et al. Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
wei lai, cao leifeng, fan wei, et al. Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray[J]. High Power Laser and Particle Beams, 2011, 23.
CAS Key Laboratory of Basic Plasma Physics,Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China;
2.
National Key Laboratory for Laser Fusion,Research Center of Laser Fusion,CAEP,P.O.Box 919-986,Mianyang 621900,China;
3.
Key Laboratory of Nano-Fabrication and Novel Devices Integrated Technology,Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
The principle of a photon sieve applied to soft X-ray spectroscopy is introduced, and the transmittance of the photon sieve is calculated. The diffraction pattern of the photon sieve is simulated and measured in visible light wave band. It is shown that the dispersive component has good single order diffraction properties, i.e. the third order and higher order diffraction can be suppressed effectively. The photon sieve applied to soft X-ray spectroscopy can realize self-sustaining easily compared with the conventional transmission grating and single-order diffraction grating designed before, and it might be employed widely for X-ray and extreme ultraviolet spectroscopic diagnoses.
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