Volume 23 Issue 07
Sep.  2012
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hou lifei, li fang, liu shenye, et al. Chemical vapor deposited diamond detectors for soft X-ray power measurement[J]. High Power Laser and Particle Beams, 2011, 23.
Citation: hou lifei, li fang, liu shenye, et al. Chemical vapor deposited diamond detectors for soft X-ray power measurement[J]. High Power Laser and Particle Beams, 2011, 23.

Chemical vapor deposited diamond detectors for soft X-ray power measurement

  • Publish Date: 2011-07-21
  • Diamonds have high thermal conductivity, resistivity and breakdown field, fast charge collection, low leakage current, wide band-gap, low dielectric constant, large carrier drift velocity and outstanding radiation hardness. A class of wide band-gap semiconductor offers an attractive alternative to Si and X-ray diode detector technologies for X-ray detection in inertial confinement fusion(ICF) experiments. Using chemical-vapor-deposited (CVD) technology, 1 mm×1 mm×2 mm(type-A) and 1 mm×1 mm×3 mm(type-B) diamonds were synthesized. The quality of the diamonds was examined by Ramma spectrum. The detectors was fielded and characteristics of these detectors were studied on a 8 ps pulse-wide laser equipment. The results indicate that rising time and FWHM of the detector system reach 60 ps and
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