suo bin, cheng yongsheng, zeng chao, et al. Uncertainty quantification of target voltage amplitude using Dempster-Shafer theory[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
suo bin, cheng yongsheng, zeng chao, et al. Uncertainty quantification of target voltage amplitude using Dempster-Shafer theory[J]. High Power Laser and Particle Beams, 2011, 23.
suo bin, cheng yongsheng, zeng chao, et al. Uncertainty quantification of target voltage amplitude using Dempster-Shafer theory[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
suo bin, cheng yongsheng, zeng chao, et al. Uncertainty quantification of target voltage amplitude using Dempster-Shafer theory[J]. High Power Laser and Particle Beams, 2011, 23.
As probability theory and interval analysis have some shortages in uncertainty quantification of target voltage in the case of limited test samples of key parameters, an uncertainty quantification method based on Dempster-Shafer(D-S) theory was described. Basic belief assignments were calculated on the basis of small samples, and belief and plausibility functions were used to construct the lower and upper probability distributions of target voltage amplitude with Monte Carlo simulation. Experiments and simulations were conducted to obtain the information of target voltage amplitude, such as its approximating probabilistic distribution, confidence interval, and interval of expected values. The results show that, compared with the conventional probability method, the method avoids the proble