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Citation: zhao jianyin, liu fang, xi wenjun, et al. Reliability assessment for metallized film pulse capacitors with accelerated degradation test[J]. High Power Laser and Particle Beams, 2011, 23.

Reliability assessment for metallized film pulse capacitors with accelerated degradation test

  • Publish Date: 2011-06-28

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    通讯作者: 陈斌, bchen63@163.com
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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