Influence on linear transformer electron beam driver from delay effects

xiang fei; tan jie; wang ganping

Volume 23 Issue 11

Sep. 2012

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Article Navigation > High Power Laser and Particle Beams > 2011 > 23(11): 0-

xu jian-cheng, shi qi-kai, chai li-qun, et al. Effect reduction of spurious fringes in interferometric measurement system[J]. High Power Laser and Particle Beams, 2006, 18.

Citation:

xiang fei, tan jie, wang ganping. Influence on linear transformer electron beam driver from delay effects[J]. High Power Laser and Particle Beams, 2011, 23.

xu jian-cheng, shi qi-kai, chai li-qun, et al. Effect reduction of spurious fringes in interferometric measurement system[J]. High Power Laser and Particle Beams, 2006, 18.

Citation:

xiang fei, tan jie, wang ganping. Influence on linear transformer electron beam driver from delay effects[J]. High Power Laser and Particle Beams, 2011, 23.

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Influence on linear transformer electron beam driver from delay effects

1.
Laboratory of High Power Microwave Technology,Institute of Applied Electronics,CAEP,P.O.Box 919-1015,Mianyang 621900,China

Publish Date: 2011-11-29

Abstract

Abstract

The paper analyzes the reason why the pulse top spreads and the rise time shortens in a fault experiment on long pulse high power linear transformer microwave driver. Effects of waves superposition delay are discussed based on current transmission model. Output pulse waveforms are then derived by three dimensional simulation on the experimental prototype under excitations of different time sequences. The result suggests that, if the module closest to the diode is the first module physically, the delay from the switch triggered can be offsetted by waves superposition delay, and thus the wave optimization can be realized.
- linear transformer,
- long pulse microwave driver,
- current transmission,
- switch delay,
- first module

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