Calibration and modeling of X-ray CCD

zhu tuo; zhang wenhai; yang jiamin; shang wanli; xiong gang; kuang longyu; zhao yidong; cui mingqi; zheng lei; tang kun; ju zaiqiang; guo zhiying; ma chenyan; sun lijuan

Volume 23 Issue 10

Nov. 2011

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Article Navigation > High Power Laser and Particle Beams > 2011 > 23(10): 0-

gao yi, yang hailiang, sun fengju, et al. Resistance-voltage-dividing load for testing of pulsed power equipment[J]. High Power Laser and Particle Beams, 2009, 21.

Citation:

zhu tuo, zhang wenhai, yang jiamin, et al. Calibration and modeling of X-ray CCD[J]. High Power Laser and Particle Beams, 2011, 23.

gao yi, yang hailiang, sun fengju, et al. Resistance-voltage-dividing load for testing of pulsed power equipment[J]. High Power Laser and Particle Beams, 2009, 21.

Citation:

zhu tuo, zhang wenhai, yang jiamin, et al. Calibration and modeling of X-ray CCD[J]. High Power Laser and Particle Beams, 2011, 23.

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Calibration and modeling of X-ray CCD

1.
Research Center of Laser Fusion,CAEP,P.O.Box 919-986,Mianyang 621900,China;
2.
National Key Laboratory of High Temperature and Density Plasmas,CAEP,Mianyang 621900,China;
3.
Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China

Publish Date: 2011-10-15

Abstract

Abstract

An X-ray charge coupled device(CCD) was calibrated on the beamline 4B7B at Beijing Synchrotron Radiation Facility after the optimization of suppressing methods for high-order harmonics. In the process of data analysis, equivalent exposure time was introduced to correct the exposure time. Then the sensitivities of the CCD in the energy range between 100 and 1 500 eV were obtained. The calibration experiment fills the data gap of the sensitivity of the CCD in the energy range between 300 and 600 eV and validates the modeling in this energy range.
- x-ray charge coupled device,
- sensitivity,
- calibration,
- mechanical shutter,
- equivalent exposure time

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