Sensitivity of photodiode detector for industrial computed tomography

Studying on sensitivity of detector has most guiding significance for the selecting of X-ray Energy, the designing of detector and matching between X-ray source and detector. Several major factors of sensitivity and their quantitative relation were studied. First, factors such as energy deposition rate, absolute scintillation efficiency, light collection efficiency and photoelectrical conversion efficiency were analyzed. Then, a simulation for energy deposition rate of scintillation crystal and light collection efficiency was carried out by Monte Carlo method. The fluorescence conversion efficiency of the CsI(Tl) scintillator and the photoelectric conversion efficiency of the photoelectric diode were computed. The concept of matching between the scintillator and the photoelectric diode was defined. Finally, the sensitivity expression with universal meaning of the detector was obtained. The maximum error between theoretical value and practical measurement result is less than 20.4%. The experiments show the validity and the accuracy of the computing method of the sensitivity.