Fen+ beam profile diagnostics based on Al2O3：Cr scintillating screen

He Tie; Lei Jiarong; Liu Meng; An Li; Wang Xinhua; Zheng Pu

Volume 25 Issue 04

Mar. 2013

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Article Navigation > High Power Laser and Particle Beams > 2013 > 25(04): 1013-1016

yuan jia-de, meng lin, yan yang, et al. Research on X-band inner coaxial disk-loaded relativistic backward-wave oscillator[J]. High Power Laser and Particle Beams, 2006, 18.

Citation:

He Tie, Lei Jiarong, Liu Meng, et al. Feⁿ⁺ beam profile diagnostics based on Al₂O₃：Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.

yuan jia-de, meng lin, yan yang, et al. Research on X-band inner coaxial disk-loaded relativistic backward-wave oscillator[J]. High Power Laser and Particle Beams, 2006, 18.

Citation:

He Tie, Lei Jiarong, Liu Meng, et al. Feⁿ⁺ beam profile diagnostics based on Al₂O₃：Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.

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Feⁿ⁺ beam profile diagnostics based on Al₂O₃：Cr scintillating screen

1.
Institute of Nuclear Physics and Chemistry,CAEP,P.O.Box 919213,Mianyang 621900,China

Received Date: 2012-08-16
Rev Recd Date: 2012-11-20
Publish Date: 2013-03-09

Abstract

Abstract

Some techniques of beam profile measurements such as wire rotating scan, Faraday cups array and infrared imagingwere investigated. A measurement device was built based on scintillating screen to cater for the demand of accelerator beam profile diagnostics. The device was bombarded under several tens to hundred nanoampere Fen+(n~512) ion beam. The Fen+ ion beam experiment shows that the imaging saturation is mainly caused by light intensity rather than scintillating screen. A way to solve the saturation problem with a specially developed lens was mentioned. The grayscale of beam profile imaging is approximately linear with respect to the beam intensity, and the reason for formation of this relationship was analyzed.
- scintillating screen,
- Fen+ beam,
- beam profile,
- diagnostics

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