高功率微波脉冲宽度效应实验研究
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摘要: 根据部分高功率微波效应实验结果，初步总结了微波脉冲宽度与效应物扰乱阈值的关系，主要结论是：效应物的扰乱阈值在其它条件固定的情况下随脉宽的增加而降低，但存在一拐点区域，在拐点区域以后脉宽再增加则扰乱阈值不再发生明显变化。Abstract: According to the latest experimental results of HPM effect on digital electronic devices, a relation between the HPM pulsewidth(PW) and the upset threshold(UT) of effect obiect is sumaried. The relation suggests that UT decreases with the increasing of PW as the other factors are fixed, wheras, there is a inflection region of UT while PW increasing. The UT changes slowly when the injecting PW is greater than the PW corresponding to the inflection region.
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Key words:
- high power microwave /
- pulse width /
- effect
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